A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures SB Mamaghani, P Pal, MB Tahoori 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 509-514, 2024 | | 2024 |
Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers P Pal, F Afentaki, H Zhao, G Saglam, M Hefenbrock, G Zervakis, M Beigl, ... 29th IEEE European Test Symposium (ETS 2024), 2024 | | 2024 |
Analog Printed Spiking Neuromorphic Circuit P Pal, H Zhao, M Shatta, M Hefenbrock, SB Mamaghani, S Nassif, M Beigl, ... 2024 Design, Automation and Test in Europe Conference (DATE), 6, 2024 | | 2024 |
Towards Temporal Information Processing–Printed Neuromorphic Circuits with Learnable Filters H Zhao, P Pal, M Hefenbrock, M Beigl, MB Tahoori Proceedings of the 18th ACM International Symposium on Nanoscale …, 2023 | | 2023 |
On-sensor Printed Machine Learning Classification via Bespoke ADC and Decision Tree Co-Design G Armeniakos, PL Duarte, P Pal, G Zervakis, MB Tahoori, D Soudris arXiv preprint arXiv:2312.01172, 2023 | | 2023 |
Power-Aware Training for Energy-Efficient Printed Neuromorphic Circuits H Zhao, P Pal, M Hefenbrock, M Beigl, MB Tahoori 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-9, 2023 | | 2023 |
Design and optimization of high voltage (HV) drain extended FinFET transistors for analog SoC applications P Pal Indian Institute of Technology Gandhinagar, 2020 | | 2020 |