| An all-in-one silicon odometer for separately monitoring HCI, BTI, and TDDB J Keane, X Wang, D Persaud, CH Kim IEEE Journal of Solid-State Circuits 45 (4), 817-829, 2010 | 239 | 2010 |
| A 23.6-Mb/mm SRAM in 10-nm FinFET Technology With Pulsed-pMOS TVC and Stepped-WL for Low-Voltage Applications Z Guo, D Kim, S Nalam, J Wiedemer, X Wang, E Karl IEEE Journal of Solid-State Circuits 54 (1), 210-216, 2018 | 69 | 2018 |
| A 0.6 V, 1.5 GHz 84 Mb SRAM in 14 nm FinFET CMOS technology with capacitive charge-sharing write assist circuitry E Karl, Z Guo, J Conary, J Miller, YG Ng, S Nalam, D Kim, J Keane, ... IEEE Journal of Solid-State Circuits 51 (1), 222-229, 2015 | 54 | 2015 |
| Silicon odometers: Compact in situ aging sensors for robust system design X Wang, J Keane, TTH Kim, P Jain, Q Tang, CH Kim IEEE micro 34 (6), 74-85, 2014 | 44 | 2014 |
| On-chip reliability monitors for measuring circuit degradation J Keane, T Kim, X Wang, CH Kim Microelectronics Reliability 50 (8), 1039-1053, 2010 | 37 | 2010 |
| Impact of interconnect length on BTI and HCI induced frequency degradation X Wang, P Jain, D Jiao, CH Kim 2012 IEEE International Reliability Physics Symposium (IRPS), 2F. 5.1-2F. 5.6, 2012 | 18 | 2012 |
| The Dependence of BTI and HCI Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications CHK X. Wang, Q. Tang, P. Jain, D. Jiao IEEE Trans. on VLSI Systems, 2014 | 17* | 2014 |
| Duty-cycle shift under asymmetric BTI aging: A simple characterization method and its application to SRAM timing X Wang, J Keane, P Jain, V Reddy, CH Kim 2013 IEEE International Reliability Physics Symposium (IRPS), 4A. 5.1-4A. 5.5, 2013 | 17 | 2013 |
| Fast characterization of PBTI and NBTI induced frequency shifts under a realistic recovery bias using a ring oscillator based circuit X Wang, S Song, A Paul, CH Kim 2014 IEEE International Reliability Physics Symposium, 6B. 2.1-6B. 2.6, 2014 | 15 | 2014 |
| A 32nm SRAM reliability macro for recovery free evaluation of NBTI and PBTI P Jain, A Paul, X Wang, CH Kim 2012 International Electron Devices Meeting, 9.7. 1-9.7. 4, 2012 | 15 | 2012 |
| RTN induced frequency shift measurements using a ring oscillator based circuit Q Tang, X Wang, J Keane, CH Kim 2013 Symposium on VLSI Technology, T188-T189, 2013 | 14 | 2013 |
| A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients S Satapathy, WH Choi, X Wang, CH Kim 2015 IEEE International Reliability Physics Symposium (IRPS), 6A.3.1 - 6A.3.5, 2015 | 13 | 2015 |
| Estimation of instantaneous frequency fluctuation in a fast DVFS environment using an empirical BTI stress-relaxation model C Zhou, X Wang, W Xu, Y Zhu, VJ Reddi, CH Kim 2014 IEEE International Reliability Physics Symposium, 2D. 2.1-2D. 2.6, 2014 | 13 | 2014 |
| SRAM Read Performance Degradation under Asymmetric NBTI and PBTI Stress: Characterization Vehicle and Statistical Aging Data CHK X. Wang, W. Xu Custom Integrated Circuits Conference, 2014 | 13 | 2014 |
| Measurement, analysis and improvement of supply noise in 3D ICs P Jain, D Jiao, X Wang, CH Kim 2011 Symposium on VLSI Circuits-Digest of Technical Papers, 46-47, 2011 | 12 | 2011 |
| A circuit-based approach for characterizing high frequency electromigration effects C Zhou, X Wang, R Fung, SJ Wen, R Wong, CH Kim IEEE Transactions on Device and Materials Reliability 17 (4), 763-772, 2017 | 10 | 2017 |
| High frequency AC electromigration lifetime measurements from a 32nm test chip C Zhou, X Wang, R Fung, SJ Wen, R Wong, CH Kim 2015 Symposium on VLSI Technology (VLSI Technology), T42-T43, 2015 | 6 | 2015 |
| On-chip silicon odometers for circuit aging characterization J Keane, X Wang, P Jain, CH Kim Bias Temperature Instability for Devices and Circuits, 679-717, 2014 | 5 | 2014 |
| A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB J Keane, X Wang, D Persaud, CH Kim 2010 IEEE International Conference on Integrated Circuit Design and …, 2010 | 3 | 2010 |
| Silicon Odometers: Compact On-chip Sensors for Monitoring Circuit Reliability Effects CHK X. Wang, J. Keane, T. Kim, P. Jain, Q. Tang Micro Journal, 2014 | | 2014 |
Pulkit JainAMDVerified email at intel.com
