| A scalable test strategy for network-on-chip routers AM Amory, E Brião, É Cota, M Lubaszewski, FG Moraes IEEE International Conference on Test, 2005., 9 pp.-599, 2005 | 158 | 2005 |
| The impact of NoC reuse on the testing of core-based systems É Cota, M Kreutz, CA Zeferino, L Carro, M Lubaszewski, A Susin Proceedings. 21st VLSI Test Symposium, 2003., 128-133, 2003 | 122 | 2003 |
| Reliability, Availability and Serviceability of Networks-on-chip É Cota, A de Morais Amory, MS Lubaszewski Springer Science & Business Media, 2011 | 121 | 2011 |
| Power-aware NoC Reuse on the Testing of Core-based Systems. E Cota, L Carro, F Wagner, M Lubaszewski International Test Conference, 612-621, 2003 | 114 | 2003 |
| A high-fault-coverage approach for the test of data, control and handshake interconnects in mesh networks-on-chip E Cota, FL Kastensmidt, M Cassel, M Hervé, P Almeida, P Meirelles, ... IEEE Transactions on Computers 57 (9), 1202-1215, 2008 | 98 | 2008 |
| Reusing an on-chip network for the test of core-based systems É Cota, L Carro, M Lubaszewski ACM Transactions on Design Automation of Electronic Systems (TODAES) 9 (4 …, 2004 | 97 | 2004 |
| Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets S Mir, M Lubaszewski, B Courtois Journal of Electronic Testing 9, 43-57, 1996 | 65 | 1996 |
| A reliable fail-safe system M Lubaszewski, B Courtois IEEE Transactions on Computers 47 (2), 236-241, 1998 | 56 | 1998 |
| Fault detection, diagnosis and prediction in electrical valves using self-organizing maps LF Gonçalves, JL Bosa, TR Balen, MS Lubaszewski, EL Schneider, ... Journal of Electronic Testing 27, 551-564, 2011 | 53 | 2011 |
| Design of self-checking fully differential circuits and boards M Lubaszewski, S Mir, V Kolarik, C Nielsen, B Courtois IEEE Transactions on Very Large Scale Integration (VLSI) Systems 8 (2), 113-128, 2000 | 50 | 2000 |
| Wrapper design for the reuse of networks-on-chip as test access mechanism AM Amory, K Goossens, EJ Marinissen, M Lubaszewski, F Moraes Eleventh IEEE European Test Symposium (ETS'06), 213-218, 2006 | 49 | 2006 |
| Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism AM Amory, K Goossens, EJ Marinissen, M Lubaszewski, F Moraes IET Computers & Digital Techniques 1 (3), 197-206, 2007 | 47 | 2007 |
| Designing self-exercising analogue checkers V Kolarik, M Lubaszewski, B Courtois Proceedings of IEEE VLSI Test Symposium, 252-257, 1994 | 47 | 1994 |
| Frequency-based BIST for analog circuit testing S Khaled, B Kaminska, B Courtois, M Lubaszewski Proceedings 13th IEEE VLSI Test Symposium, 54-59, 1995 | 45 | 1995 |
| Unified built-in self-test for fully differential analog circuits S Mir, M Lubaszewski, B Courtois Journal of Electronic Testing 9, 135-151, 1996 | 44 | 1996 |
| Improving yield of torus NoCs through fault-diagnosis-and-repair of interconnect faults C Concatto, P Almeida, F Kastensmidt, E Cota, M Lubaszewski, M Herve 2009 15th IEEE International On-Line Testing Symposium, 61-66, 2009 | 42 | 2009 |
| Designing a radiation hardened 8051-like micro-controller FG de Lima, E Cota, L Carro, M Lubaszewski, R Reis, R Velazco, ... Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000 | 42 | 2000 |
| Analog checkers with absolute and relative tolerances V Kolarik, S Mir, M Lubaszewski, B Courtois IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1995 | 42 | 1995 |
| Microsystems testing: an approach and open problems M Lubaszewski, ÉF Cota, B Courtois Proceedings of the conference on Design, automation and test in Europe, 524-529, 1998 | 41 | 1998 |
| A new adaptive analog test and diagnosis system EF Cota, M Negreiros, L Carro, M Lubaszewski IEEE Transactions on Instrumentation and Measurement 49 (2), 223-227, 2000 | 40 | 2000 |
