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Miklos Menyhard
Miklos Menyhard
EK
Verifisert e-postadresse på energia.mta.hu
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Amorphisation and surface morphology development at low-energy ion milling
A Barna, B Pécz, M Menyhard
Ultramicroscopy 70 (3), 161-171, 1998
1621998
TEM sample preparation by ion milling/amorphization
A Barna, B Pécz, M Menyhard
Micron 30 (3), 267-276, 1999
1371999
Sulfur-induced dynamic embrittlement in a low-alloy steel
D Bika, JA Pfaendtner, M Menyhard, CJ McMahon Jr
Acta metallurgica et materialia 43 (5), 1895-1908, 1995
1141995
Grain boundary segregation and transformations in Bi-doped polycrystalline copper
M Menyhard, B Blum, CJ McMahon Jr
Acta Metallurgica 37 (2), 549-557, 1989
961989
Atomistic vs phenomenological approaches to grain boundary segregation: Computer modeling of Cu Ag alloys
M Menyhard, M Yan, V Vitek
Acta metallurgica et materialia 42 (8), 2783-2796, 1994
661994
On the effect of molybdenum in the embrittlement of phosphorus-doped iron
M Menyhard, CJ McMahon Jr
Acta Metallurgica 37 (8), 2287-2295, 1989
601989
Interdiffusion in amorphous Si/Ge multilayers by Auger depth profiling technique
A Csik, GA Langer, DL Beke, Z Erdélyi, M Menyhard, A Sulyok
Journal of Applied Physics 89 (1), 804-806, 2001
532001
In situ measurements of arsenic losses during annealing of the usual evaporated contacts of GaAs Gunn diodes
T Sebestyen, M Menyhard, D Szigethy
Electronics Letters 4 (12), 96-97, 1976
471976
LEED study of quartz crystals
I Janossy, M Menyhard
Surface Science 25 (3), 647-649, 1971
431971
Auger depth profile analysis of deeply buried interfaces
A Barna, M Menyhard
physica status solidi (a) 145 (2), 263-274, 1994
421994
Quasi-static intergranular cracking in a Cu-Sn alloy: An analog of stress relief cracking of steels
EV Barrera, M Menyhard, D Bika, B Rothman, CJ McMahon Jr
Pennsylvania Univ., Philadelphia, PA (United States), 1991
391991
Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films
K Balázsi, IE Lukács, S Gurbán, M Menyhárd, L Bacáková, ...
Journal of the European Ceramic Society 33 (12), 2217-2221, 2013
382013
Determination of the inelastic mean free path (IMFP) of electrons in germanium and silicon by elastic peak electron spectroscopy (EPES) using an analyser of high resolution
G Gergely, A Konkol, M Menyhard, B Lesiak, A Jablonski, D Varga, J Toth
Vacuum 48 (7-9), 621-624, 1997
381997
Hydrogen and surface excitation in electron spectra of polyethylene
GT Orosz, G Gergely, M Menyhard, J Tóth, D Varga, B Lesiak, A Jablonski
Surface science 566, 544-548, 2004
372004
Surface morphology development during ion sputtering: roughening or smoothing?
Z Csahok, Z Farkas, M Menyhard, G Gergely, CS Daroczi
Surface science 364 (2), L600-L604, 1996
371996
Surface excitation effects in electron spectroscopy
G Gergely, M Menyhard, S Gurban, A Sulyok, J Toth, D Varga, ...
Solid State Ionics 141, 47-51, 2001
362001
Experimental determination of the inelastic mean free path (IMFP) of electrons in Cr, Mo, Ge and Si based on the elastic peak intensity ratio with a Ni reference sample
G Gergely, M Menyhard, K Pentek, A Sulyok, A Jablonski, B Lesiak, ...
Surface science 331, 1203-1207, 1995
361995
Experimental determination of the inelastic mean free path for Cu, Ag, W, Au and Ta, in the energy range 500–3000 eV by elastic peak electron spectroscopy and using Ni …
G Gergely, M Menyhard, K Pentek, A Sulyok, A Jablonski, B Lesiak, ...
Vacuum 46 (5-6), 591-594, 1995
361995
Passivation of GaAs (001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source
G Monier, L Bideux, C Robert-Goumet, B Gruzza, M Petit, JL Lábár, ...
Surface science 606 (13-14), 1093-1099, 2012
342012
Experimental measurements of the surface excitation parameters of Cu, Au, Ni, Ag, Ge and Pd based on Si and other reference standard materials
G Gergely, M Menyhard, S Gurban, J Toth, D Varga
Surface and Interface Analysis: An International Journal devoted to the …, 2004
342004
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Artikler 1–20