Impact of directional walk on atom probe microanalysis B Gault, F Danoix, K Hoummada, D Mangelinck, H Leitner Ultramicroscopy 113, 182-191, 2012 | 167 | 2012 |
Phase transitions, energy storage performances and electrocaloric effect of the lead-free Ba0.85Ca0.15Zr0.10Ti0.90O3 ceramic relaxor Z Hanani, D Mezzane, M Amjoud, AG Razumnaya, S Fourcade, Y Gagou, ... Journal of Materials Science: Materials in Electronics 30, 6430-6438, 2019 | 88 | 2019 |
Grain-boundary segregation of boron in high-strength steel studied by nano-SIMS and atom probe tomography G Da Rosa, P Maugis, A Portavoce, J Drillet, N Valle, E Lentzen, ... Acta Materialia 182, 226-234, 2020 | 74 | 2020 |
Snowplow effect and reactive diffusion in the Pt doped Ni–Si system O Cojocaru-Mirédin, D Mangelinck, K Hoummada, E Cadel, D Blavette, ... Scripta materialia 57 (5), 373-376, 2007 | 66 | 2007 |
Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si D Mangelinck, K Hoummada, A Portavoce, C Perrin, R Daineche, ... Scripta Materialia 62 (8), 568-571, 2010 | 62 | 2010 |
Effect of Pt addition on Ni silicide formation at low temperature: Growth, redistribution, and solubility K Hoummada, C Perrin-Pellegrino, D Mangelinck Journal of Applied Physics 106 (6), 2009 | 60 | 2009 |
First stages of the formation of Ni silicide by atom probe tomography K Hoummada, E Cadel, D Mangelinck, C Perrin-Pellegrino, D Blavette, ... Applied physics letters 89 (18), 2006 | 55 | 2006 |
Nickel segregation on dislocation loops in implanted silicon K Hoummada, D Mangelinck, B Gault, M Cabié Scripta Materialia 64 (5), 378-381, 2011 | 53 | 2011 |
Kinetics of a transient silicide during the reaction of Ni thin film with (100) Si D Mangelinck, K Hoummada, I Blum Applied Physics Letters 95 (18), 2009 | 46 | 2009 |
Structural, dielectric, and ferroelectric properties of lead-free BCZT ceramics elaborated by low-temperature hydrothermal processing Z Hanani, D Mezzane, M Amjoud, Y Gagou, K Hoummada, C Perrin, ... Journal of Materials Science: Materials in Electronics 31, 10096-10104, 2020 | 45 | 2020 |
Three dimensional distributions of arsenic and platinum within NiSi contact and gate of an n-type transistor F Panciera, K Hoummada, M Gregoire, M Juhel, N Bicais, D Mangelinck Applied Physics Letters 99 (5), 2011 | 44 | 2011 |
Composition measurement of the Ni-silicide transient phase by atom probe tomography K Hoummada, I Blum, D Mangelinck, A Portavoce Applied Physics Letters 96 (26), 2010 | 41 | 2010 |
A methodology for the measurement of the interfacial excess of solute at a grain boundary P Maugis, K Hoummada Scripta Materialia 120, 90-93, 2016 | 39 | 2016 |
Effect of stress on the transformation of Ni2Si into NiSi D Mangelinck, K Hoummada Applied Physics Letters 92 (25), 2008 | 34 | 2008 |
Atom probe tomography for advanced metallization D Mangelinck, F Panciera, K Hoummada, M El Kousseifi, C Perrin, ... Microelectronic engineering 120, 19-33, 2014 | 33 | 2014 |
Progress in the understanding of Ni silicide formation for advanced MOS structures D Mangelinck, K Hoummada, F Panciera, M El Kousseifi, I Blum, ... physica status solidi (a) 211 (1), 152-165, 2014 | 31 | 2014 |
Direct epitaxial growth of θ-Ni2Si by reaction of a thin Ni (10 at.% Pt) film with Si (1 0 0) substrate F Panciera, D Mangelinck, K Hoummada, M Texier, M Bertoglio, ... Scripta Materialia 78, 9-12, 2014 | 30 | 2014 |
Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis F Panciera, K Hoummada, M Gregoire, M Juhel, F Lorut, N Bicais, ... Microelectronic engineering 107, 167-172, 2013 | 29 | 2013 |
Influence of heating rate on ferrite recrystallization and austenite formation in cold-rolled microalloyed dual-phase steels C Philippot, M Bellavoine, M Dumont, K Hoummada, J Drillet, V Hebert, ... Metallurgical and Materials Transactions A 49, 66-77, 2018 | 28 | 2018 |
Static and dynamical ageing processes at room temperature in a Fe25Ni0. 4C virgin martensite: effect of C redistribution at the nanoscale S Allain, F Danoix, M Goune, K Hoummada, D Mangelinck Philosophical magazine letters 93 (2), 68-76, 2013 | 28 | 2013 |