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Aleksei Savenko
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SiGeSn ternaries for efficient group IV heterostructure light emitters
N von den Driesch, D Stange, S Wirths, D Rainko, I Povstugar, A Savenko, ...
Small 13 (16), 1603321, 2017
642017
Note: Optical fiber milled by focused ion beam and its application for Fabry-Pérot refractive index sensor
W Yuan, F Wang, A Savenko, DH Petersen, O Bang
Review of Scientific Instruments 82 (7), 2011
562011
Ultra-thin YBa2Cu3O7− x films with high critical current density
M Lyatti, A Savenko, U Poppe
Superconductor science and technology 29 (6), 065017, 2016
232016
Temperature dependence of laves phase composition in Nb, W and Si-alloyed high chromium ferritic steels for SOFC interconnect applications
L Niewolak, A Savenko, D Grüner, H Hattendorf, U Breuer, ...
Journal of phase equilibria and diffusion 36, 471-484, 2015
232015
Microstructural insights into the coercivity enhancement of grain-boundary-diffusion-processed Tb-treated Nd-Fe-B sintered magnets beyond the core-shell formation mechanism
KŽ Soderžnik, KŽ Rožman, M Komelj, A Kovács, P Diehle, T Denneulin, ...
Journal of Alloys and Compounds 864, 158915, 2021
202021
Experimental evidence for hotspot and phase-slip mechanisms of voltage switching in ultrathin nanowires
M Lyatti, MA Wolff, A Savenko, M Kruth, S Ferrari, U Poppe, W Pernice, ...
Physical Review B 98 (5), 054505, 2018
20*2018
Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam milling
A Savenko, I Yildiz, DH Petersen, P Břggild, M Bartenwerfer, F Krohs, ...
Nanotechnology 24 (46), 465701, 2013
202013
Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy
V Grillo, AH Tavabi, E Yucelen, PH Lu, F Venturi, H Larocque, L Jin, ...
Optics express 25 (18), 21851-21860, 2017
182017
Tunable Ampere phase plate for low dose imaging of biomolecular complexes
AH Tavabi, M Beleggia, V Migunov, A Savenko, O Öktem, ...
Scientific reports 8 (1), 5592, 2018
172018
Automated handling and assembly of customizable AFM-tips
M Bartenwerfer, V Eichhorn, D Jasper, S Fatikow, A Savenko, ...
2011 IEEE International Symposium on Assembly and Manufacturing (ISAM), 1-6, 2011
152011
Switching and hysteresis on the I–V curves of submicron BSCCO (2212) bridges
SG Zybtsev, VY Pokrovskii, IG Gorlova, YI Latyshev, VV Luchinin, ...
Journal of Low Temperature Physics 139, 281-288, 2005
112005
Nucleation of normal phase in the dynamic resistive state in submicron Bi2212 bridges
SG Zybtsev, VY Pokrovskii, IG Gorlova, YI Latyshev, VV Luchinin, ...
Journal of Low Temperature Physics 139, 351-359, 2005
112005
Thin TaC layer produced by ion mixing
Á Barna, L Kotis, B Pécz, A Sulyok, G Sáfrán, AL Tóth, M Menyhárd, ...
Surface and Coatings Technology 206 (19-20), 3917-3922, 2012
102012
Self-Organized Porous Structure with Several Levels of Pores in Electrochemical Anodized Silicon
YM Spivak, VA Moshnikov, VV Kuznetsov, AY Savenko, ...
6th Workshop on Functional and Nanostructured Materials. 10th Conference on …, 2009
72009
Out-of-plane bending based on SiN-ion-irradiation and bilayer structures for easy access for micromanipulation
A Savenko, I Yildiz, P Břggild
Microelectronic engineering 110, 398-402, 2013
52013
Design of a micro-cartridge system for the robotic assembly of exchangeable afm-probe tips
M Bartenwerfer, V Eichhorn, S Fatikow, M Becker, A Savenko, I Yildiz, ...
2013 IEEE International Conference on Robotics and Automation, 1730-1735, 2013
52013
Memory resistive switching in CeO2-based film microstructures patterned by a focused ion beam
A Velichko, P Boriskov, A Savenko, A Grishin, S Khartsev, MA Yar, ...
Thin solid films 556, 520-524, 2014
42014
Features of the technology and properties of photodetectors based on metal-porous silicon carbide structures
AV Afanas’ ev, VA Il’in, NM Korovkina, AY Savenko
Technical physics letters 31, 629-631, 2005
32005
Generation of π modes in semiconductor vertical-cavity surface-emitting lasers
GS Sokolovskii, VV Dudelev, AM Monakhov, AY Savenko, SA Blokhin, ...
Technical Physics Letters 35, 1133-1136, 2009
22009
Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond
B Van Leer, R Kelley, A Genc, A Savenko
Microscopy and Microanalysis 22 (S3), 178-179, 2016
12016
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