| The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay F CAPPUZZELLO, C AGODI, M CAVALLARO, D CARBONE, S TUDISCO, ... 10.1140/epja/i2018-12509-3, 54-72, 2018 | 207 | 2018 |
| Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC LA Tambara, FL Kastensmidt, NH Medina, N Added, VAP Aguiar, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015 | 53 | 2015 |
| Lockstep dual-core ARM A9: Implementation and resilience analysis under heavy ion-induced soft errors ÁB de Oliveira, GS Rodrigues, FL Kastensmidt, N Added, ELA Macchione, ... IEEE Transactions on Nuclear Science 65 (8), 1783-1790, 2018 | 49 | 2018 |
| Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ... IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016 | 45 | 2016 |
| Experimental setup for single event effects at the são paulo 8ud pelletron accelerator VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 45 | 2014 |
| Dynamic distribution of potassium in sugarcane NH Medina, MLT Branco, MAG da Silveira, RBB Santos Journal of Environmental Radioactivity 126, 172-175, 2013 | 45 | 2013 |
| Phosphogypsum analysis: total content and extractable element concentrations RF Gennari, NH Medina, I Garcia, MAG Silveira | 45 | 2011 |
| Evaluating soft core RISC-V processor in SRAM-based FPGA under radiation effects AB de Oliveira, LA Tambara, F Benevenuti, LAC Benites, N Added, ... IEEE Transactions on Nuclear Science 67 (7), 1503-1510, 2020 | 41 | 2020 |
| Reliability on ARM processors against soft errors through SIHFT techniques E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ... IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016 | 40 | 2016 |
| Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ... IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017 | 38 | 2017 |
| Boosting the total ionizing dose tolerance of digital switches by using OCTO SOI MOSFET LN de Souza Fino, ED Neto, MAG da Silveira, C Renaux, D Flandre, ... Semiconductor Science and Technology 30 (10), 105024, 2015 | 32 | 2015 |
| Measurement of critical exponents of diamond films by atomic force microscopy imaging MG SILVEIRA, MC SALVADORI, M CATTANI Physical Review E - Statistical Physics, Plasmas, Fluids and Related …, 1998 | 24* | 1998 |
| Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors LA Tambara, J Tonfat, A Santos, FL Kastensmidt, NH Medina, N Added, ... IEEE Transactions on Nuclear Science 64 (2), 874-881, 2017 | 22 | 2017 |
| Radiation effect mechanisms in electronic devices MA da Silveira, RB Santos, F Leite, F Cunha, KH Cirne, NH Medina, ... Proceedings of the Science, Montevideo, Uruguay, 1-6, 2013 | 20 | 2013 |
| Improving the X-ray radiation tolerance of the analog ICs by using OCTO layout style LN de Souza Fino, MAG da Silveira, C Renaux, D Flandre, SP Gimenez 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013), 1-4, 2013 | 20 | 2013 |
| Study of proton radiation effects among diamond and rectangular gate MOSFET layouts LE Seixas, S Finco, MAG Silveira, NH Medina, SP Gimenez Materials Research Express 4 (1), 015901, 2017 | 18 | 2017 |
| Performance of electronic devices submitted to X-rays and high energy proton beams MAG Silveira, KH Cirne, RBB Santos, SP Gimenez, NH Medina, N Added, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012 | 17 | 2012 |
| X-ray radiation effects in overlapping circular-gate MOSFET's JA De Lima, MAG Silveira, KH Cirne, RBB Santos, NH Medina 2011 12th European Conference on Radiation and Its Effects on Components and …, 2011 | 15 | 2011 |
| Experimental setups for single event effect studies NH MEDINA, VÂP de Aguiar, N Added, F Aguirre, ELA Macchione, ... Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 2016 | 14 | 2016 |
| Roughness and critical exponents analysis of diamond films by AFM imaging MAG SILVEIRA, MC SALVADORI, M CATTANI Thin Solid Films 345, 1, 1999 | 13* | 1999 |
Nilberto H. MedinaProfessor, Universidade de São PauloDirección de correo verificada de if.usp.br
