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Terje Finstad
Terje Finstad
Department of Physics, University of Oslo
Verified email at fys.uio.no
Title
Cited by
Cited by
Year
Phase stability, electronic structure, and optical properties of indium oxide polytypes
SZ Karazhanov, P Ravindran, P Vajeeston, A Ulyashin, TG Finstad, ...
Physical Review B 76 (7), 075129, 2007
2592007
Transient enhanced diffusion during rapid thermal annealing of boron implanted silicon
K Cho, M Numan, TG Finstad, WK Chu, J Liu, JJ Wortman
Applied physics letters 47 (12), 1321-1323, 1985
1411985
Lattice-matched Sc1-xErxAs/GaAs heterostructures: A demonstration of new systems for fabricating lattice-matched metallic compounds to semiconductors
CJ Palmstrøm, S Mounier, TG Finstad, PF Miceli
Applied physics letters 56 (4), 382-384, 1990
941990
A Xe marker study of the transformation of Ni2Si to NiSi in thin films
TG Finstad
Physica status solidi (a) 63 (1), 223-228, 1981
831981
Doping of p‐type ZnSb: Single parabolic band model and impurity band conduction
PHM Böttger, GS Pomrehn, GJ Snyder, TG Finstad
physica status solidi (a) 208 (12), 2753-2759, 2011
742011
Reaction of silicon with films of Co Ni alloys: Phase separation of the monosilicides and nucleation of the disilicides
FM d'Heurle, DD Anfiteatro, VR Deline, TG Finstad
Thin Solid Films 128 (1-2), 107-124, 1985
741985
Characterization of Ge nanocrystals embedded in SiO2 by Raman spectroscopy
U Serincan, G Kartopu, A Guennes, TG Finstad, R Turan, Y Ekinci, ...
Semiconductor science and technology 19 (2), 247, 2003
692003
Etch rates of (100),(111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry
E Steinsland, T Finstad, A Hanneborg
Sensors and Actuators A: Physical 86 (1-2), 73-80, 2000
642000
Thermoelectric properties of Cu doped ZnSb containing Zn3P2 particles
K Valset, PHM Böttger, J Taftø, TG Finstad
Journal of Applied Physics 111 (2), 023703, 2012
612012
Design and construction of a four-point bending based set-up for measurement of piezoresistance in semiconductors
E Lund, TG Finstad
Review of scientific instruments 75 (11), 4960-4966, 2004
612004
Structural study of GaSb/AlSb strained-layer superlattice
CK Pan, DC Zheng, TG Finstad, WK Chu, VS Speriosu, MA Nicolet, ...
Physical Review B 31 (3), 1270, 1985
601985
The role of grain boundary scattering in reducing the thermal conductivity of polycrystalline XNiSn (X= Hf, Zr, Ti) half-Heusler alloys
M Schrade, K Berland, SNH Eliassen, MN Guzik, C Echevarria-Bonet, ...
Scientific reports 7 (1), 1-10, 2017
592017
Low temperature interdiffusion in Au/In thin film couples
J Bjøntegaard, L Buene, T Finstad, O Lønsjø, T Olsen
Thin Solid Films 101 (3), 253-262, 1983
571983
AlAl thermocompression bonding for wafer-level MEMS sealing
N Malik, K Schjølberg-Henriksen, E Poppe, MMV Taklo, TG Finstad
Sensors and Actuators A: Physical 211, 115-120, 2014
562014
Silicide formation with nickel and platinum double layers on silicon
TG Finstad
Thin Solid Films 51 (3), 411-424, 1978
561978
The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
TG Finstad, DD Anfiteatro, VR Deline, FM d'Heurle, P Gas, VL Moruzzi, ...
Thin Solid Films 135 (2), 229-243, 1986
531986
Electronic Transport Properties of [Ca2CoO3−δ]q[CoO2]
M Schrade, H Fjeld, TG Finstad, T Norby
The Journal of Physical Chemistry C 118 (6), 2908-2918, 2014
512014
Self‐Aligned Ti Silicide Formed by Rapid Thermal Annealing
T Brat, CM Osburn, T Finstad, J Liu, B Ellington
Journal of the Electrochemical Society 133 (7), 1451, 1986
511986
Channeling effect for low energy ion implantation in Si
K Cho, WR Allen, TG Finstad, WK Chu, J Liu, JJ Wortman
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1985
481985
Measurement of thin film thermal conductivity using the laser flash method
M Ruoho, K Valset, T Finstad, I Tittonen
Nanotechnology 26 (19), 195706, 2015
472015
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