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Yi CuiStanford UniversityVerified email at stanford.edu
Nian LiuGeorgia Institute of TechnologyVerified email at chbe.gatech.edu
Jack A. LewisGeorgia Institute of TechnologyVerified email at gatech.edu
Seok Woo LeeSchool of Electrical and Electronic Engineering, Nanyang Technological UniversityVerified email at ntu.edu.sg
Hui WuTsinghua UniversityVerified email at mail.tsinghua.edu.cn
Matthew BoebingerCenter for Nanophase Materials Science at Oak Ridge National LaboratoryVerified email at ornl.gov
Yuan YangColumbia University, MIT, StanfordVerified email at columbia.edu
William D. NixStanford UniversityVerified email at stanford.edu
Yan YaoHugh Roy and Lillie Cranz Cullen Distinguished Professor, University of HoustonVerified email at uh.edu
Francisco Javier Quintero CortesAssistant Professor, Civil Engineering Department, Pontificia Universidad JaverianaVerified email at javeriana.edu.co
judy j. chaProfessor, Materials Science and Engineering, Cornell UniversityVerified email at cornell.edu
Pralav P. ShettyVP and GM, Electron Microscopy and Failure Analysis, Covalent MetrologyVerified email at covalentmetrology.com
Stephanie Elizabeth SandovalGeorgia Institute of TechnologyVerified email at gatech.edu
Hyun-Wook LeeEnergy and Chemical Engineering, UNISTVerified email at unist.ac.kr
Neha KondekarAppleVerified email at gatech.edu
Ariel JacksonVerified email at stanford.edu
Chongmin Wang (王崇民)Pacific northwest National laboratoryVerified email at pnnl.gov
Ill RyuSeoul National UniversityVerified email at snu.ac.kr
Yuhgene LiuGraduate Student, Georgia Institute of TechnologyVerified email at gatech.edu
Akila C. ThenuwaraSenior Battery Scientist, Corning IncorporatedVerified email at me.gatech.edu
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Matthew T. McDowell
Associate Professor, Georgia Institute of Technology
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