| Impacts of process variations and aging on lifetime reliability of flip-flops: A comparative analysis A Jafari, M Raji, B Ghavami IEEE Transactions on Device and Materials Reliability 19 (3), 551-562, 2019 | 12 | 2019 |
| Timing reliability improvement of master-slave flip-flops in the presence of aging effects A Jafari, M Raji, B Ghavami IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4761-4773, 2020 | 9 | 2020 |
| BTI-aware timing reliability improvement of pulsed flip-flops in nano-scale CMOS technology A Jafari, M Raji, B Ghavami IEEE Transactions on Device and Materials Reliability 21 (3), 379-388, 2021 | 4 | 2021 |
| Reliability of Computing-In-Memory Concepts Based on Memristive Arrays DJ Wouters, L Brackmann, A Jafari, C Bengel, M Mayahinia, R Waser, ... 2022 International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2022 | 3 | 2022 |
| Voltage tuning for reliable computation in emerging resistive memories M Mayahinia, A Jafari, MB Tahoori 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 3 | 2022 |
| Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies B Sapui, J Krautter, M Mayahinia, A Jafari, D Gnad, S Meschkov, ... 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 1 | 2023 |
| Design Limitations in Oxide-Based Memristive Ternary Content Addressable Memories L Brackmann, T Ziegler, A Jafari, DJ Wouters, M Tahoori, S Menzel 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023 | 1 | 2023 |
| Improved Arithmetic Performance by Combining Stateful and Non‐Stateful Logic in Resistive Random Access Memory 1T–1R Crossbars L Brackmann, T Ziegler, A Jafari, DJ Wouters, MB Tahoori, S Menzel Advanced Intelligent Systems 6 (3), 2300579, 2024 | | 2024 |
| A Spintronic 2M/7T Computation-in-Memory Cell A Jafari, C Münch, M Tahoori Journal of Low Power Electronics and Applications 12 (4), 63, 2022 | | 2022 |
| MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories A Jafari, M Mayahinia, ST Ahmed, C Münch, MB Tahoori 2022 25th Euromicro Conference on Digital System Design (DSD), 332-339, 2022 | | 2022 |
| A failure analysis framework of ReRAM In-Memory Logic operations L Brackmann, A Jafari, C Bengel, M Mayahinia, R Waser, D Wouters, ... 2022 IEEE International Test Conference in Asia (ITC-Asia), 67-72, 2022 | | 2022 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, GermanyVerified email at kit.edu
