| The Nanometer optical component measuring machine: a new Sub‐nm topography measuring device for X‐ray optics at BESSY F Siewert, T Noll, T Schlegel, T Zeschke, H Lammert AIP Conference Proceedings 705 (1), 847-850, 2004 | 178 | 2004 |
| The Variable Polarization XUV Beamline P04 at PETRA III: Optics, mechanics and their performance J Viefhaus, F Scholz, S Deinert, L Glaser, M Ilchen, J Seltmann, P Walter, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2013 | 171 | 2013 |
| The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability SG Alcock, KJS Sawhney, S Scott, U Pedersen, R Walton, F Siewert, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 170 | 2010 |
| Spatio-temporal coherence of free electron laser pulses in the soft x-ray regime R Mitzner, B Siemer, M Neeb, T Noll, F Siewert, S Roling, M Rutkowski, ... Optics express 16 (24), 19909-19919, 2008 | 160 | 2008 |
| Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry F Siewert, J Buchheim, S Boutet, GJ Williams, PA Montanez, J Krzywinski, ... Optics express 20 (4), 4525-4536, 2012 | 143 | 2012 |
| Direct autocorrelation of soft-x-ray free-electron-laser pulses by time-resolved two-photon double ionization of He R Mitzner, AA Sorokin, B Siemer, S Roling, M Rutkowski, H Zacharias, ... Physical Review A 80 (2), 025402, 2009 | 141 | 2009 |
| Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler VV Yashchuk, S Barber, EE Domning, JL Kirschman, GY Morrison, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 118 | 2010 |
| Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging A Rack, T Weitkamp, M Riotte, D Grigoriev, T Rack, L Helfen, T Baumbach, ... Journal of synchrotron radiation 17 (4), 496-510, 2010 | 87 | 2010 |
| Characterization and calibration of 2nd generation slope measuring profiler F Siewert, J Buchheim, T Zeschke Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 83 | 2010 |
| The nanometer optical component measuring machine F Siewert, H Lammert, T Zeschke Modern Developments in X-ray and Neutron Optics, 193-200, 2008 | 71 | 2008 |
| Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8 Y Senba, H Kishimoto, H Ohashi, H Yumoto, T Zeschke, F Siewert, S Goto, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 63 | 2010 |
| On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology F Siewert, J Buchheim, T Zeschke, M Störmer, G Falkenberg, R Sankari Journal of Synchrotron Radiation 21 (5), 968-975, 2014 | 62 | 2014 |
| Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations L Samoylova, H Sinn, F Siewert, H Mimura, K Yamauchi, T Tschentscher EUV and X-Ray Optics: Synergy between Laboratory and Space 7360, 129-137, 2009 | 61 | 2009 |
| The XUV split-and-delay unit at beamline BL2 at FLASH M Wöstmann, R Mitzner, T Noll, S Roling, B Siemer, F Siewert, ... Journal of Physics B: Atomic, Molecular and Optical Physics 46 (16), 164005, 2013 | 59 | 2013 |
| Fabrication of X-ray mirrors for synchrotron applications H Thiess, H Lasser, F Siewert Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 54 | 2010 |
| The at-wavelength metrology facility for UV-and XUV-reflection and diffraction optics at BESSY-II F Schäfers, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, ... Journal of Synchrotron Radiation 23 (1), 67-77, 2016 | 53 | 2016 |
| Finishing procedure for high-performance synchrotron optics A Schindler, T Haensel, A Nickel, HJ Thomas, H Lammert, F Siewert Optical Manufacturing and Testing V 5180, 64-72, 2003 | 53 | 2003 |
| Sub-nm accuracy metrology for ultra-precise reflective X-ray optics F Siewert, J Buchheim, T Zeschke, G Brenner, S Kapitzki, K Tiedtke Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 52 | 2011 |
| Proposal for a universal test mirror for characterization of slope measuring instruments VV Yashchuk, WR McKinney, T Warwick, T Noll, F Siewert, T Zeschke, ... Advances in Metrology for X-Ray and EUV Optics II 6704, 82-93, 2007 | 52 | 2007 |
| Advanced metrology: an essential support for the surface finishing of high performance x-ray optics F Siewert, H Lammert, T Noll, T Schlegel, T Zeschke, T Hänsel, A Nickel, ... Advances in Metrology for X-ray and EUV Optics 5921, 592101, 2005 | 47 | 2005 |
Sebastian RolingWWU Münster Verifisert e-postadresse på uni-muenster.de
