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Frank Siewert
Frank Siewert
Verifisert e-postadresse på helmholtz-berlin.de
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The Nanometer optical component measuring machine: a new Sub‐nm topography measuring device for X‐ray optics at BESSY
F Siewert, T Noll, T Schlegel, T Zeschke, H Lammert
AIP Conference Proceedings 705 (1), 847-850, 2004
1782004
The Variable Polarization XUV Beamline P04 at PETRA III: Optics, mechanics and their performance
J Viefhaus, F Scholz, S Deinert, L Glaser, M Ilchen, J Seltmann, P Walter, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2013
1712013
The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability
SG Alcock, KJS Sawhney, S Scott, U Pedersen, R Walton, F Siewert, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
1702010
Spatio-temporal coherence of free electron laser pulses in the soft x-ray regime
R Mitzner, B Siemer, M Neeb, T Noll, F Siewert, S Roling, M Rutkowski, ...
Optics express 16 (24), 19909-19919, 2008
1602008
Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry
F Siewert, J Buchheim, S Boutet, GJ Williams, PA Montanez, J Krzywinski, ...
Optics express 20 (4), 4525-4536, 2012
1432012
Direct autocorrelation of soft-x-ray free-electron-laser pulses by time-resolved two-photon double ionization of He
R Mitzner, AA Sorokin, B Siemer, S Roling, M Rutkowski, H Zacharias, ...
Physical Review A 80 (2), 025402, 2009
1412009
Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler
VV Yashchuk, S Barber, EE Domning, JL Kirschman, GY Morrison, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
1182010
Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging
A Rack, T Weitkamp, M Riotte, D Grigoriev, T Rack, L Helfen, T Baumbach, ...
Journal of synchrotron radiation 17 (4), 496-510, 2010
872010
Characterization and calibration of 2nd generation slope measuring profiler
F Siewert, J Buchheim, T Zeschke
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
832010
The nanometer optical component measuring machine
F Siewert, H Lammert, T Zeschke
Modern Developments in X-ray and Neutron Optics, 193-200, 2008
712008
Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8
Y Senba, H Kishimoto, H Ohashi, H Yumoto, T Zeschke, F Siewert, S Goto, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
632010
On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology
F Siewert, J Buchheim, T Zeschke, M Störmer, G Falkenberg, R Sankari
Journal of Synchrotron Radiation 21 (5), 968-975, 2014
622014
Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations
L Samoylova, H Sinn, F Siewert, H Mimura, K Yamauchi, T Tschentscher
EUV and X-Ray Optics: Synergy between Laboratory and Space 7360, 129-137, 2009
612009
The XUV split-and-delay unit at beamline BL2 at FLASH
M Wöstmann, R Mitzner, T Noll, S Roling, B Siemer, F Siewert, ...
Journal of Physics B: Atomic, Molecular and Optical Physics 46 (16), 164005, 2013
592013
Fabrication of X-ray mirrors for synchrotron applications
H Thiess, H Lasser, F Siewert
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
542010
The at-wavelength metrology facility for UV-and XUV-reflection and diffraction optics at BESSY-II
F Schäfers, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, ...
Journal of Synchrotron Radiation 23 (1), 67-77, 2016
532016
Finishing procedure for high-performance synchrotron optics
A Schindler, T Haensel, A Nickel, HJ Thomas, H Lammert, F Siewert
Optical Manufacturing and Testing V 5180, 64-72, 2003
532003
Sub-nm accuracy metrology for ultra-precise reflective X-ray optics
F Siewert, J Buchheim, T Zeschke, G Brenner, S Kapitzki, K Tiedtke
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011
522011
Proposal for a universal test mirror for characterization of slope measuring instruments
VV Yashchuk, WR McKinney, T Warwick, T Noll, F Siewert, T Zeschke, ...
Advances in Metrology for X-Ray and EUV Optics II 6704, 82-93, 2007
522007
Advanced metrology: an essential support for the surface finishing of high performance x-ray optics
F Siewert, H Lammert, T Noll, T Schlegel, T Zeschke, T Hänsel, A Nickel, ...
Advances in Metrology for X-ray and EUV Optics 5921, 592101, 2005
472005
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