| High performance La/B4C multilayer mirrors with barrier layers for the next generation lithography NI Chkhalo, S Künstner, VN Polkovnikov, NN Salashchenko, F Schäfers, ... Applied Physics Letters 102 (1), 2013 | 82 | 2013 |
| The at-wavelength metrology facility for UV-and XUV-reflection and diffraction optics at BESSY-II F Schäfers, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, ... Journal of Synchrotron Radiation 23 (1), 67-77, 2016 | 57 | 2016 |
| At-wavelength metrology facility for soft X-ray reflection optics A Sokolov, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, M Mast, ... Review of Scientific Instruments 87 (5), 2016 | 49 | 2016 |
| An XUV optics beamline at BESSY II AA Sokolov, F Eggenstein, A Erko, R Follath, S Künstner, M Mast, ... Advances in Metrology for X-Ray and EUV Optics V 9206, 138-150, 2014 | 49 | 2014 |
| Nucleophilic versus electrophilic reactivity of bioinspired superoxido nickel (II) complexes C Panda, A Chandra, T Corona, E Andris, B Pandey, S Garai, ... Angewandte Chemie International Edition 57 (45), 14883-14887, 2018 | 24 | 2018 |
| VCO-based ESR-on-a-chip as a tool for low-cost, high-sensitivity food quality control A Chu, B Schlecker, J Handwerker, S Künstner, M Ortmanns, K Lips, ... 2017 IEEE Biomedical Circuits and Systems Conference (BioCAS), 1-4, 2017 | 10 | 2017 |
| Rapid-scan electron paramagnetic resonance using an EPR-on-a-Chip sensor S Künstner, A Chu, KP Dinse, A Schnegg, JE McPeak, B Naydenov, ... Magnetic Resonance 2 (2), 673-687, 2021 | 8 | 2021 |
| VCO-based ESR-on-a-chip as a tool for low-cost, high-sensitivity point-of-care diagnostics B Schlecker, A Chu, J Handwerker, S Kiinstner, M Ortmanns, K Lips, ... 2017 IEEE SENSORS, 1-3, 2017 | 4 | 2017 |
| Rev. Sci. Instrum. A Sokolov, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, M Mast, ... | 4 | 2016 |
| Live demonstration: A VCO-based point-of-care ESR spectrometer B Schlecker, A Chu, J Handwerker, S Künstner, M Ortmanns, K Lips, ... 2017 IEEE SENSORS, 1-1, 2017 | 1 | 2017 |
| Live demonstration: A VCO-based point-of-care ESR spectrometer A Chu, B Schlecker, J Handwerker, S Künstner, M Ortmanns, K Lips, ... 2017 IEEE Biomedical Circuits and Systems Conference (BioCAS), 1-1, 2017 | | 2017 |
| At-wavelength metrology facility for soft X-ray reflection optics P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, M Mast, ... Review of Scientific Instruments 87 (5), 2016 | | 2016 |
| Том. 9206. Advances in Metrology for X-Ray and EUV Optics V F Eggenstein, P Bischoff, A Gaupp, F Senf, A Sokolov, T Zeschke, ... | | 2014 |
| An XUV At-Wavelength Metrology facility at BESSY-II A Sokolov, P Bischoff, F Eggenstein, A Erko, A Gaupp, S Künstner, M Mast, ... | | |
