Soft error interception latch: Double node charge sharing SEU tolerant design K Katsarou, Y Tsiatouhas
Electronics Letters 51 (4), 330-332, 2015
113 2015 Double node charge sharing SEU tolerant latch design K Katsarou, Y Tsiatouhas
2014 IEEE 20th International On-Line Testing Symposium (IOLTS), 122-127, 2014
69 2014 New high-speed multioutput carry look-ahead adders C Efstathiou, Z Owda, Y Tsiatouhas
IEEE Transactions on Circuits and Systems II: Express Briefs 60 (10), 667-671, 2013
51 2013 Octupole Vibration in Superdeformed T Lauritsen, RVF Janssens, MP Carpenter, P Fallon, B Herskind, ...
Physical review letters 89 (28), 282501, 2002
51 2002 Comparative study of different current mode sense amplifiers in submicron CMOS technology A Chrisanthopoulos, Y Moisiadis, Y Tsiatouhas, A Arapoyanni
IEE Proceedings-Circuits, Devices and Systems 149 (3), 154-158, 2002
46 2002 Timing error tolerance in nanometer ICs S Valadimas, Y Tsiatouhas, A Arapoyanni
2010 IEEE 16th International On-Line Testing Symposium, 283-288, 2010
31 2010 A built-in-test circuit for RF differential low noise amplifiers LE Dermentzoglou, A Arapoyanni, Y Tsiatouhas
IEEE Transactions on Circuits and Systems I: Regular Papers 57 (7), 1549-1558, 2010
30 2010 A circuit for concurrent detection of soft and timing errors in digital CMOS ICs S Matakias, Y Tsiatouhas, A Arapoyanni, T Haniotakis
Journal of Electronic Testing 20, 523-531, 2004
28 2004 The time dilation technique for timing error tolerance S Valadimas, A Floros, Y Tsiatouhas, A Arapoyanni, X Kavousianos
IEEE Transactions on Computers 63 (5), 1277-1286, 2012
24 2012 Static power reduction using variation-tolerant and reconfigurable multi-mode power switches Z Zhang, X Kavousianos, K Chakrabarty, Y Tsiatouhas
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (1), 13-26, 2013
23 2013 New memory sense amplifier designs in CMOS technology Y Tsiatouhas, A Chrisanthopoulos, G Kamoulakos, T Haniotakis
ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and …, 2000
23 2000 Fast deployment of alternate analog test using Bayesian model fusion J Liaperdos, HG Stratigopoulos, L Abdallah, Y Tsiatouhas, A Arapoyanni, ...
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
22 2015 Low power scan by partitioning and scan hold E Arvaniti, Y Tsiatouhas
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
20 2012 Cost and power efficient timing error tolerance in flip-flop based microprocessor cores S Valadimas, Y Tsiatouhas, A Arapoyanni
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
19 2012 A robust and reconfigurable multi-mode power gating architecture Z Zhang, X Kavousianos, K Chakrabarty, Y Tsiatouhas
2011 24th Internatioal Conference on VLSI Design, 280-285, 2011
19 2011 A hierarchical architecture for concurrent soft error detection based on current sensing Y Tsiatouhas, A Arapoyanni, D Nikolos, T Haniotakis
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW …, 2002
19 2002 A stress-relaxed negative voltage-level converter YE Tsiatouhas
IEEE Transactions on Circuits and Systems II: Express Briefs 54 (3), 282-286, 2007
18 2007 A design technique for energy reduction in NORA CMOS logic K Limniotis, Y Tsiatouhas, T Haniotakis, A Arapoyanni
IEEE Transactions on Circuits and Systems I: Regular Papers 53 (12), 2647-2655, 2006
18 2006 The time dilation scan architecture for timing error detection and correction A Floros, Y Tsiatouhas, X Kavousianos
IFIP/IEEE International Conference on Very Large Scale Integration, 569-574, 2008
17 2008 The use of pre-evaluation phase in dynamic CMOS logic A Rao, T Haniotakis, Y Tsiatouhas, H Djemil
IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design …, 2005
17 2005