| Automatic test data generation for c programs P Bokil, P Darke, U Shrotri, R Venkatesh Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009 …, 2009 | 42 | 2009 |
| Test generation for large automotive models R Venkatesh, U Shrotri, P Darke, P Bokil Industrial Technology (ICIT), 2012 IEEE International Conference on, 662-667, 2012 | 26 | 2012 |
| TIC: a scalable model checking based approach to WCET estimation R Metta, M Becker, P Bokil, S Chakraborty, R Venkatesh Proceedings of the 17th ACM SIGPLAN/SIGBED Conference on Languages …, 2016 | 16 | 2016 |
| Effectiveness of random testing of embedded systems P Krishnan, R Venkatesh, P Bokil, T Muske, V Suman 2012 45th Hawaii International Conference on System Sciences, 5556-5563, 2012 | 12 | 2012 |
| System and method for automatic test data generation for relational testing VS Pasupuleti, T Muske, P Bokil, U Shrotri, V Ramanathan, P Darke US Patent 8,589,736, 2013 | 10 | 2013 |
| On implementational variations in static analysis tools T Muske, P Bokil 2015 IEEE 22nd International Conference on Software Analysis, Evolution and …, 2015 | 9 | 2015 |
| Achieving Effective Test Suites for Reactive Systems using Specification Mining and Test Suite Reduction Techniques P Bokil, P Krishnan, R Venkatesh ACM SIGSOFT Software Engineering Notes 40 (1), 1-8, 2015 | 8 | 2015 |
| Masking boundary value coverage: Effectiveness and efficiency PV Suman, T Muske, P Bokil, U Shrotri, R Venkatesh Testing–Practice and Research Techniques, 8-22, 2010 | 5 | 2010 |
| STATEMATE to SCADE model translation R Venky, S Ulka, A Kulkarni, P Bokil Proceedings of the 1st India software engineering conference, 145-146, 2008 | 3 | 2008 |
| Generating Effective Test Suites for Reactive Systems Using Specification Mining P Bokil | 1 | 2014 |
Ulka ShrotriTRDDC, Tata Consultancy ServicesVerifisert e-postadresse på tcs.com
