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Alberto Herrera-Gomez
Alberto Herrera-Gomez
CINVESTAV-Unidad Queretaro
Verified email at cinvestav.mx
Title
Cited by
Cited by
Year
Modern theory and applications of photocathodes
WE Spicer, A Herrera-Gomez
Photodetectors and Power Meters 2022, 18-35, 1993
3061993
Practical methods for background subtraction in photoemission spectra
A Herrera‐Gomez, M Bravo‐Sanchez, O Ceballos‐Sanchez, ...
Surface and Interface Analysis 46 (10-11), 897-905, 2014
1512014
Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2p obtained with Al Kα radiation: I: cobalt spinel
D Cabrera‐German, G Gomez‐Sosa, A Herrera‐Gomez
Surface and Interface Analysis 48 (5), 252-256, 2016
1002016
Chemical depth profile of ultrathin nitrided films
A Herrera-Gómez, A Hegedus, PL Meissner
Applied physics letters 81 (6), 1014-1016, 2002
882002
Identification of bound water through infrared spectroscopy in methylcellulose
G Velazquez, A Herrera-Gómez, MO Martı́n-Polo
Journal of Food Engineering 59 (1), 79-84, 2003
802003
Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy
B Singh, A Diwan, V Jain, A Herrera-Gomez, J Terry, MR Linford
Applied Surface Science 387, 155-162, 2016
642016
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature
GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 38 (6 …, 2020
622020
The slope-background for the near-peak regimen of photoemission spectra
A Herrera-Gomez, M Bravo-Sanchez, FS Aguirre-Tostado, ...
Journal of Electron Spectroscopy and Related Phenomena 189, 76-80, 2013
602013
Photoemission from the Sr/Si (001) interface
A Herrera-Gomez, FS Aguirre-Tostado, Y Sun, P Pianetta, Z Yu, ...
Journal of Applied Physics 90 (12), 6070-6072, 2001
542001
Photocatalytic degradation of 2, 4-dichlorophenoxyacetic acid under visible light: effect of synthesis route
K Del Ángel-Sanchez, O Vázquez-Cuchillo, A Aguilar-Elguezabal, ...
Materials chemistry and physics 139 (2-3), 423-430, 2013
532013
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
MH Engelhard, DR Baer, A Herrera-Gomez, PMA Sherwood
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 38 (6 …, 2020
522020
Composition assessment of ferric oxide by accurate peak fitting of the Fe 2p photoemission spectrum
M Bravo Sanchez, JA Huerta‐Ruelas, D Cabrera‐German, ...
Surface and Interface Analysis 49 (4), 253-260, 2017
492017
Resolving overlapping peaks in ARXPS data: the effect of noise and fitting method
J Muñoz-Flores, A Herrera-Gomez
Journal of Electron Spectroscopy and Related Phenomena 184 (11-12), 533-541, 2012
492012
Analysis of the water bound to a polymer matrix by infrared spectroscopy
A Herrera-Gómez, G Velázquez-Cruz, MO Martín-Polo
Journal of Applied Physics 89 (10), 5431-5437, 2001
472001
Physics of high‐intensity nanosecond electron source: Charge limit phenomenon in GaAs photocathodes
A Herrera‐Gómez, G Vergara, WE Spicer
Journal of applied physics 79 (9), 7318-7323, 1996
471996
Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’
A Herrera‐Gomez, JT Grant, PJ Cumpson, M Jenko, FS Aguirre‐Tostado, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2009
462009
Proliferation of faulty materials data analysis in the literature
MR Linford, VS Smentkowski, JT Grant, CR Brundle, PMA Sherwood, ...
Microscopy and Microanalysis 26 (1), 1-2, 2020
422020
Electronic structure and Schottky-barrier formation on GaAs (100) surfaces prepared by thermal desorption of a protective arsenic coating
CJ Spindt, M Yamada, PL Meissner, KE Miyano, T Kendelewicz, ...
Physical Review B 45 (19), 11108, 1992
421992
Instrument-related geometrical factors affecting the intensity in XPS and ARXPS experiments
A Herrera-Gomez, FS Aguirre-Tostado, PG Mani-Gonzalez, ...
Journal of Electron Spectroscopy and Related Phenomena 184 (8-10), 487-500, 2011
402011
In/Si (111)-√ 3×√ 3 interface: An unrelaxed T 4 geometry
JC Woicik, T Kendelewicz, A Herrera-Gomez, KE Miyano, PL Cowan, ...
Physical review letters 71 (8), 1204, 1993
401993
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