Baihong Jin (金柏宏)
Baihong Jin (金柏宏)
Andre navn金 柏宏
Verifisert e-postadresse på eecs.berkeley.edu - Startside
Sitert av
Sitert av
MAD-GAN: Multivariate anomaly detection for time series data with generative adversarial networks
D Li, D Chen, B Jin, L Shi, J Goh, SK Ng
International Conference on Artificial Neural Networks, 703-716, 2019
One-class graph neural networks for anomaly detection in attributed networks
X Wang, B Jin, Y Du, P Cui, Y Tan, Y Yang
Neural computing and applications 33, 12073-12085, 2021
Design Automation for Smart Building Systems
R Jia*, B Jin*, M Jin, Y Zhou, IC Konstantakopoulos, H Zou, J Kim, D Li, ...
Proceedings of the IEEE 106 (9), 1680 - 1699, 2018
An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing
B Jin*, Y Tan*, A Nettekoven, Y Chen, Y Yue, U Topcu, ...
2019 18th IEEE International Conference On Machine Learning And Applications …, 2019
A one-class support vector machine calibration method for time series change point detection
B Jin, Y Chen, D Li, K Poolla, A Sangiovanni-Vincentelli
2019 IEEE International conference on prognostics and health management …, 2019
Detecting and diagnosing incipient building faults using uncertainty information from deep neural networks
B Jin, D Li, S Srinivasan, SK Ng, K Poolla, A Sangiovanni-Vincentelli
2019 IEEE International Conference on Prognostics and Health Management …, 2019
Explainable AI for chiller fault-detection systems: gaining human trust
S Srinivasan, P Arjunan, B Jin, AL Sangiovanni-Vincentelli, Z Sultan, ...
Computer 54 (10), 60-68, 2021
Evaluation of a cost-responsive supply air temperature reset strategy in an office building
P Raftery, S Li, B Jin, M Ting, G Paliaga, H Cheng
Energy and Buildings 158, 356-370, 2018
Distribution System Voltage Control under Uncertainties using Tractable Chance Constraints
P Li, B Jin, D Wang, B Zhang
https://arxiv.org/abs/1704.08999v3, 2018
Learning convex piecewise linear machine for data-driven optimal control
Y Zhou, B Jin, CJ Spanos
2015 IEEE 14th International Conference on Machine Learning and Applications …, 2015
A fast and accurate approach for common path pessimism removal in static timing analysis
B Jin, G Luo, W Zhang
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2623-2626, 2016
Exploiting Uncertainties from Ensemble Learners to Improve Decision-Making in Healthcare AI
Y Tan*, B Jin*, X Yue, Y Chen, A Sangiovanni Vincentelli
arXiv preprint arXiv:2007.06063, 2020
Augmenting Monte Carlo dropout classification models with unsupervised learning tasks for detecting and diagnosing out-of-distribution faults
B Jin, Y Tan, Y Chen, A Sangiovanni-Vincentelli
arXiv preprint arXiv:1909.04202, 2019
A Contract-based Framework for Integrated Demand Response Management in Smart Grids
B Jin, P Nuzzo, M Maasoumy, Y Zhou, A Sangiovanni-Vincentelli
Proceedings of the 2nd ACM International Conference on Embedded Systems for …, 2015
Gordian: Formal reasoning-based outlier detection for secure localization
M Weber, B Jin, G Lederman, Y Shoukry, EA Lee, S Seshia, ...
ACM Transactions on Cyber-Physical Systems 4 (4), 1-27, 2020
Single-step fabrication of superhydrophobic micro/nano dual-scale PDMS film replicated from ultra-low-surface-energy mold
XS Zhang, BH Jin, SG Chu, N Peter, FY Zhu, HX Zhang
2013 IEEE 26th International Conference on Micro Electro Mechanical Systems …, 2013
Synthetic data in DC microgrids: Label creation for ensemble learning for fault isolation
T Wang, Y Tan, Y Wang, B Jin, A Monti, AL Sangiovanni-Vincentelli
IEEE Transactions on Power Delivery 37 (3), 2301-2313, 2021
Using Ensemble Classifiers to Detect Incipient Anomalies
B Jin, Y Tan, A Liu, X Yue, Y Chen, A Sangiovanni Vincentelli
arXiv preprint arXiv:2008.08710, 2020
A tractable ellipsoidal approximation for voltage regulation problems
P Li, B Jin, R Xiong, D Wang, A Sangiovanni-Vincentelli, B Zhang
2019 American Control Conference (ACC), 1301-1306, 2019
Class-wise thresholding for robust out-of-distribution detection
M Guarrera, B Jin, TW Lin, MA Zuluaga, Y Chen, ...
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2022
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Artikler 1–20