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Cristina Meinhardt
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Año
Design of regular layouts to improve predictability
C Menezes, C Meinhardt, R Reis, R Tavares
2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006
912006
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
C Meinhardt, AL Zimpeck, RAL Reis
Microelectronics Reliability 54 (9-10), 2319-2324, 2014
622014
A low-cost solution for deploying processor cores in harsh environments
M Violante, C Meinhardt, R Reis, MS Reorda
IEEE Transactions on Industrial Electronics 58 (7), 2617-2626, 2011
482011
A low-cost SEE mitigation solution for soft-processors embedded in systems on pogrammable chips
MS Reorda, M Violante, C Meinhardt, R Reis
2009 Design, Automation & Test in Europe Conference & Exhibition, 352-357, 2009
362009
Logic synthesis meets machine learning: Trading exactness for generalization
S Rai, WL Neto, Y Miyasaka, X Zhang, M Yu, Q Yi, M Fujita, GB Manske, ...
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
302021
Impact of PVT variability on 20 nm FinFET standard cells
AL Zimpeck, C Meinhardt, RAL Reis
Microelectronics Reliability 55 (9-10), 1379-1383, 2015
302015
Impact of different transistor arrangements on gate variability
AL Zimpeck, C Meinhardt, L Artola, G Hubert, FL Kastensmidt, RAL Reis
Microelectronics Reliability 88, 111-115, 2018
292018
FinFET basic cells evaluation for regular layouts
C Meinhardt, R Reis
2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2013
252013
Impact of gate workfunction fluctuation on FinFET standard cells
C Meinhardt, AL Zimpeck, R Reis
2014 21st IEEE International Conference on Electronics, Circuits and Systems …, 2014
242014
Evaluation of variability using schmitt trigger on full adders layout
LB Moraes, AL Zimpeck, C Meinhardt, R Reis
Microelectronics reliability 88, 116-121, 2018
232018
Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies
RB Almeida, CM Marques, PF Butzen, FRG Silva, RAL Reis, C Meinhardt
Microelectronics Reliability 88, 196-202, 2018
222018
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology
YQ De Aguiar, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, RAL Reis
Microelectronics Reliability 76, 660-664, 2017
222017
FinFET cells with different transistor sizing techniques against PVT variations
AL Zimpeck, C Meinhardt, G Posser, R Reis
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 45-48, 2016
212016
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability
YQ de Aguiar, C Meinhardt, RAL Reis
2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017
172017
Pros and cons of schmitt trigger inverters to mitigate pvt variability on full adders
SP Toledo, AL Zimpeck, R Reis, C Meinhardt
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
152018
PVT variability analysis of FinFET and CMOS XOR circuits at 16nm
FGRG da Silva, PF Butzen, C Meinhardt
2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016
152016
Fast logic optimization using decision trees
BA De Abreu, A Berndt, IS Campos, C Meinhardt, JT Carvalho, M Grellert, ...
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
142021
Circuit-level hardening techniques to mitigate soft errors in finfet logic gates
AL Zimpeck, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, R Reis
2019 19th European Conference on Radiation and Its Effects on Components and …, 2019
132019
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices
AL Zimpeck, C Meinhardt, R Reis
2014 24th International Workshop on Power and Timing Modeling, Optimization …, 2014
132014
Multi-level design influences on robustness evaluation of 7nm FinFET technology
LH Brendler, AL Zimpeck, C Meinhardt, R Reis
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 553-564, 2019
112019
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