Brian Simonds
Brian Simonds
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Cited by
Submicron gap capacitor for measurement of breakdown voltage in air
E Hourdakis, BJ Simonds, NM Zimmerman
Review of scientific instruments 77 (3), 034702, 2006
Why the long-term charge offset drift in Si single-electron tunneling transistors is much smaller (better) than in metal-based ones: Two-level fluctuator stability
NM Zimmerman, WH Huber, B Simonds, E Hourdakis, A Fujiwara, Y Ono, ...
Journal of Applied Physics 104 (3), 033710, 2008
Time-resolved absorptance and melt pool dynamics during intense laser irradiation of a metal
BJ Simonds, J Sowards, J Hadler, E Pfeif, B Wilthan, J Tanner, C Harris, ...
Physical review applied 10 (4), 044061, 2018
Portable, high-accuracy, non-absorbing laser power measurement at kilowatt levels by means of radiation pressure
P Williams, J Hadler, F Maring, R Lee, K Rogers, B Simonds, M Spidell, ...
Optics Express 25 (4), 4382-4392, 2017
Charge offset stability in tunable-barrier Si single-electron tunneling devices
NM Zimmerman, BJ Simonds, A Fujiwara, Y Ono, Y Takahashi, H Inokawa
Applied Physics Letters 90 (3), 033507, 2007
Measurements of thermophysical properties of solid and liquid NIST SRM 316L stainless steel
P Pichler, BJ Simonds, JW Sowards, G Pottlacher
Journal of Materials Science 55 (9), 4081-4093, 2020
Energy-coupling mechanisms revealed through simultaneous keyhole depth and absorptance measurements during laser-metal processing
TR Allen, W Huang, JR Tanner, W Tan, JM Fraser, BJ Simonds
Physical Review Applied 13 (6), 064070, 2020
Highly efficient charge transfer in nanocrystalline Si: H solar cells
KG Kiriluk, JD Fields, BJ Simonds, YP Pai, PL Miller, T Su, B Yan, J Yang, ...
Applied Physics Letters 102 (13), 133101, 2013
The causal relationship between melt pool geometry and energy absorption measured in real time during laser-based manufacturing
BJ Simonds, J Tanner, A Artusio-Glimpse, PA Williams, N Parab, C Zhao, ...
Applied Materials Today 23, 101049, 2021
Laser processing for thin film chalcogenide photovoltaics: a review and prospectus
BJ Simonds, HJ Meadows, S Misra, C Ferekides, PJ Dale, MA Scarpulla
Journal of Photonics for Energy 5 (1), 050999-050999, 2015
Low-cycle fatigue behavior of fiber-laser welded, corrosion-resistant, high-strength low alloy sheet steel
JW Sowards, EA Pfeif, MJ Connolly, JD McColskey, SL Miller, BJ Simonds, ...
Materials & Design 121, 393-405, 2017
Electron transfer in hydrogenated nanocrystalline silicon observed by time-resolved terahertz spectroscopy
MR Bergren, BJ Simonds, B Yan, G Yue, R Ahrenkiel, TE Furtak, ...
Physical Review B 87 (8), 081301, 2013
Onset of periodic oscillations as a precursor of a transition to pore-generating turbulence in laser melting
SA Khairallah, T Sun, BJ Simonds
Additive Manufacturing Letters 1, 100002, 2021
An upper bound to the frequency dependence of the cryogenic vacuum-gap capacitor
NM Zimmerman, BJ Simonds, Y Wang
Metrologia 43 (5), 383, 2006
Dynamic laser absorptance measured in a geometrically characterized stainless-steel powder layer
BJ Simonds, EJ Garboczi, TA Palmer, PA Williams
Physical review applied 13 (2), 024057, 2020
Using photoluminescence to monitor the optoelectronic properties of methylammonium lead halide perovskites in light and dark over periods of days
V Kheraj, BJ Simonds, A Toshniwal, S Misra, P Peroncik, C Zhang, ...
Journal of Luminescence 194, 353-358, 2018
Pulsed laser induced ohmic back contact in CdTe solar cells
BJ Simonds, V Palekis, B Van Devener, C Ferekides, MA Scarpulla
Applied Physics Letters 104 (14), 141604, 2014
Pulsed UV laser annealing of polycrystalline CdTe
BJ Simonds, V Palekis, MI Khan, CS Ferekides, MA Scarpulla
Laser Material Processing for Solar Energy Devices II 8826, 25-30, 2013
Pulsed KrF excimer laser dopant activation in nanocrystal silicon in a silicon dioxide matrix
T Zhang, B Simonds, K Nomoto, B Puthen Veettil, Z Lin, I Perez Wurfl, ...
Applied Physics Letters 108 (8), 083103, 2016
CuInSe2 semiconductor formation by laser annealing
HJ Meadows, D Regesch, M Thevenin, J Sendler, T Schuler, S Misra, ...
Thin Solid Films 582, 23-26, 2015
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