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Steven Theiss
Steven Theiss
3M Company
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Cited by
Cited by
Year
Methods and displays utilizing integrated zinc oxide row and column drivers in conjunction with organic light emitting diodes
PF Baude, SD Theiss, MA Haase, EW Hemmesch
US Patent 7,298,084, 2007
37062007
Recent progress in organic electronics: Materials, devices, and processes
TW Kelley, PF Baude, C Gerlach, DE Ender, D Muyres, MA Haase, ...
Chemistry of Materials 16 (23), 4413-4422, 2004
10702004
Pentacene-based radio-frequency identification circuitry
PF Baude, DA Ender, MA Haase, TW Kelley, DV Muyres, SD Theiss
Applied Physics Letters 82 (22), 3964-3966, 2003
9752003
In-line deposition processes for circuit fabrication
PF Baude, PR Fleming, MA Haase, TW Kelley, DV Muyres, S Theiss
US Patent 6,821,348, 2004
2492004
In-line deposition processes for thin film battery fabrication
T Kelley, S Theiss, D Muyres, P Baude, M Haase
US Patent App. 10/685,725, 2005
1842005
Aperture masks for circuit fabrication
PF Baude, PR Fleming, MA Haase, TW Kelley, DV Muyres, S Theiss
US Patent 6,897,164, 2005
1492005
Amorphous silicon thin-film transistors on steel foil substrates
SD Theiss, S Wagner
IEEE Electron Device Letters 17 (12), 578-580, 1996
1351996
Polysilicon thin film transistors fabricated on low temperature plastic substrates
PG Carey, PM Smith, SD Theiss, P Wickboldt
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 17 (4 …, 1999
1271999
Polysilicon thin film transistors fabricated at 100/spl deg/C on a flexible plastic substrate
SD Theiss, PG Carey, PM Smith, P Wickboldt, TW Sigmon, YJ Tung, ...
International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998
661998
Organic semiconductor RFID transponders
PF Baude, DA Ender, TW Kelley, MA Haase, DV Muyres, SD Theiss
IEEE International Electron Devices Meeting 2003, 8.1. 1-8.1. 4, 2003
592003
Self-passivated copper gates for amorphous silicon thin-film transistors
H Sirringhaus, SD Theiss, A Kahn, S Wagner
IEEE Electron Device Letters 18 (8), 388-390, 1997
521997
Method for patterning surface modification
S Theiss, T Dunbar
US Patent App. 11/010,846, 2006
462006
Pressure measurement at high temperature using ten Sm: YAG fluorescence peaks
Y Zhao, W Barvosa-Carter, SD Theiss, S Mitha, MJ Aziz, D Schiferl
Journal of Applied Physics 84 (8), 4049-4059, 1998
461998
Aperture masks for circuit fabrication
P Baude, P Fleming, M Haase, T Kelley, D Muyres, S Theiss
US Patent App. 11/775,076, 2008
372008
Thin film transistors for foldable displays
EY Ma, SD Theiss, MH Lu, CC Wu, JC Sturn, S Wagner
International Electron Devices Meeting. IEDM Technical Digest, 535-538, 1997
361997
Integration of organic LEDs and amorphous Si TFTs onto unbreakable metal foil substrates
CC Wu, S Theiss, MH Lu, JC Sturm, S Wagner
International Electron Devices Meeting. Technical Digest, 957-959, 1996
331996
Method of making transistors
SD Theiss, PF Baude, MA Haase, SK Theiss
US Patent 6,667,215, 2003
322003
Pressure‐enhanced interdiffusion in amorphous Si/Ge multilayers
SD Theiss, F Spaepen, MJ Aziz
Applied physics letters 68 (9), 1226-1228, 1996
281996
Rfid sensor
P Baude, S Theiss
US Patent App. 11/276,805, 2007
252007
Method for patterning films
S Theiss
US Patent App. 10/734,684, 2005
172005
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