| Procedure to count atoms with trustworthy single-atom sensitivity S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ... Physical Review B—Condensed Matter and Materials Physics 87 (6), 064107, 2013 | 162 | 2013 |
| Electron ptychographic microscopy for three-dimensional imaging S Gao, P Wang, F Zhang, GT Martinez, PD Nellist, X Pan, AI Kirkland Nature Communications 8 (1), 163, 2017 | 135 | 2017 |
| Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations A De Backer, GT Martinez, A Rosenauer, S Van Aert Ultramicroscopy 134, 23-33, 2013 | 121 | 2013 |
| Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy GT Martinez, A Rosenauer, A De Backer, J Verbeeck, S Van Aert Ultramicroscopy 137, 12-19, 2014 | 99 | 2014 |
| Incommensurate Modulation and Luminescence in the CaGd2(1–x)Eu2x(MoO4)4(1–y)(WO4)4y (0 ≤ x ≤ 1, 0 ≤ y ≤ 1) Red Phosphors VA Morozov, A Bertha, KW Meert, S Van Rompaey, D Batuk, GT Martinez, ... Chemistry of Materials 25 (21), 4387-4395, 2013 | 99 | 2013 |
| Correction of non-linear thickness effects in HAADF STEM electron tomography W Van den Broek, A Rosenauer, B Goris, GT Martinez, S Bals, S Van Aert, ... Ultramicroscopy 116, 8-12, 2012 | 99 | 2012 |
| Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution H Yang, I MacLaren, L Jones, GT Martinez, M Simson, M Huth, H Ryll, ... Ultramicroscopy 180, 173-179, 2017 | 97 | 2017 |
| Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography JG Lozano, GT Martinez, L Jin, PD Nellist, PG Bruce Nano Letters 18 (11), 6850-6855, 2018 | 76 | 2018 |
| First Monolithic Integration of 3D Complementary FET (CFET) on 300mm Wafers S Subramanian, M Hosseini, T Chiarella, S Sarkar, P Schuddinck, ... 2020 IEEE Symposium on VLSI Technology, 1-2, 2020 | 70 | 2020 |
| Direct observation of luminescent silver clusters confined in faujasite zeolites T Altantzis, E Coutino-Gonzalez, W Baekelant, GT Martinez, ... ACS nano 10 (8), 7604-7611, 2016 | 69 | 2016 |
| Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy KHW van den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ... Physical review letters 116 (24), 246101, 2016 | 65 | 2016 |
| High dose efficiency atomic resolution imaging via electron ptychography TJ Pennycook, GT Martinez, PD Nellist, JC Meyer Ultramicroscopy 196, 131-135, 2019 | 62 | 2019 |
| Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting A De Backer, GT Martinez, KE MacArthur, L Jones, A Béché, PD Nellist, ... Ultramicroscopy 151, 56-61, 2015 | 61 | 2015 |
| Forksheet FETs for Advanced CMOS Scaling: Forksheet-Nanosheet Co-Integration and Dual Work Function Metal Gates at 17nm NP Space H Mertens, R Ritzenthaler, Y Oniki, B Briggs, BT Chan, A Hikavyy, T Hopf, ... 2021 Symposium on VLSI Technology, 1-2, 2021 | 57 | 2021 |
| Contrast transfer and noise considerations in focused-probe electron ptychography CM O’Leary, GT Martinez, E Liberti, MJ Humphry, AI Kirkland, PD Nellist Ultramicroscopy, 113189, 2020 | 54 | 2020 |
| Interstitial Boron Atoms in the Palladium Lattice of an Industrial Type of Nanocatalyst: Properties and Structural Modifications T Chen, I Ellis, TJN Hooper, E Liberti, L Ye, BTW Lo, C O’Leary, ... Journal of the American Chemical Society 141 (50), 19616-19624, 2019 | 53 | 2019 |
| Site occupation of Nb atoms in ternary Ni–Ti–Nb shape memory alloys H Shi, J Frenzel, GT Martinez, S Van Rompaey, A Bakulin, S Kulkova, ... Acta materialia 74, 85-95, 2014 | 46 | 2014 |
| Quantitative STEM normalisation: the importance of the electron flux GT Martinez, L Jones, A De Backer, A Béché, J Verbeeck, S Van Aert, ... Ultramicroscopy 159, 46-58, 2015 | 42 | 2015 |
| Atomic resolution mapping of phonon excitations in STEM-EELS experiments R Egoavil, N Gauquelin, GT Martinez, S Van Aert, G Van Tendeloo, ... Ultramicroscopy 147, 1-7, 2014 | 41 | 2014 |
| Advanced electron crystallography through model-based imaging S Van Aert, A De Backer, GT Martinez, AJ den Dekker, D Van Dyck, ... IUCrJ 3 (1), 71-83, 2016 | 39 | 2016 |
