Sharad Seth
Sharad Seth
Emeritus Professor
Verified email at cse.unl.edu
Title
Cited by
Cited by
Year
A prototype document image analysis system for technical journals
G Nagy, S Seth, M Viswanathan
Computer 25 (7), 10-22, 1992
5591992
Hierarchical representation of optically scanned documents
G Nagy, SC Seth
4381984
HGA: A hardware-based genetic algorithm
SD Scott, A Samal, S Seth
Proceedings of the 1995 ACM third international symposium on Field …, 1995
2391995
Syntactic segmentation and labeling of digitized pages from technical journals
M Krishnamoorthy, G Nagy, S Seth, M Viswanathan
IEEE Transactions on Pattern Analysis and Machine Intelligence 15 (7), 737-747, 1993
2381993
PREDICT: Probabilistic estimation of digital circuit testability
SC Seth
Proc. 15th Int. Fault-Tolerant Computer Symp., 220-225, 1985
2351985
A feature-based approach to conflation of geospatial sources
A Samal, S Seth, K Cueto 1
International Journal of Geographical Information Science 18 (5), 459-489, 2004
2012004
Document analysis with an expert system
G Nagy, SC Seth, SD Stoddard
Pattern recognition in practice II, 149-155, 1985
1801985
Fault coverage requirement in production testing of LSI circuits
VD Agrawal, SC Seth, P Agrawal
IEEE Journal of Solid-State Circuits 17 (1), 57-61, 1982
1331982
Tutorial test generation for VLSI chips
VD Agrawal, SC Seth
IEEE Computer Society, 1988
1231988
A system for recognizing a large class of engineering drawings
Y Yu, A Samal, SC Seth
IEEE Transactions on Pattern Analysis and Machine Intelligence 19 (8), 868-890, 1997
1051997
A statistical theory of digital circuit testability
SC Seth, VD Agrawal, H Farhat
IEEE Transactions on Computers 39 (4), 582-586, 1990
821990
Characterizing the LSI yield equation from wafer test data
SC Seth, VD Agrawal
811984
A new model for computation of probabilistic testability in combinational circuits
SC Seth, VD Agrawal
Integration 7 (1), 49-75, 1989
631989
An analysis of the use of Rademacher–Walsh spectrum in compact testing
TC Hsiao
IEEE transactions on computers 100 (10), 934-937, 1984
631984
An exact analysis for efficient computation of random-pattern testability in combinational circuits
SC Seth, BB Bhattacharya, V Agrawal
611986
A Lamarckian evolution strategy for genetic algorithms
BJ Ross
Practical handbook of genetic algorithms: complex coding systems 3, 1-16, 1999
601999
Decoding substitution ciphers by means of word matching with application to OCR
G Nagy, S Seth, K Einspahr
IEEE Transactions on Pattern Analysis and Machine Intelligence, 710-715, 1987
561987
An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited
DV Das, SC Seth, PT Wagner, JC Anderson, VD Agrawal
Proceedings. International Test Conference 1990, 712-720, 1990
531990
Generating tests for delay faults in nonscan circuits
P Agrawal, VD Agrawal, SC Seth
IEEE Design & Test of Computers 10 (1), 20-28, 1993
491993
Diagnosis of faults in linear tree networks
SC Seth, KL Kodandapani
IEEE Transactions on Computers 100 (1), 29-33, 1977
481977
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Articles 1–20